Introduction to Scanning Electron Microscopy WS20/21 2020/2021 /KursID:3346
- Letzter Beitrag vom 2023-01-18
Schlüsselworte: Scanning Electron Microscopy

Lehrende(r)

Dr.-Ing. Thomas Przybilla

Einrichtung

Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

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Vorlesungsreihe

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IdM-Anmeldung

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1
REM_01_Introduction_WS20_21 preview image
REM_01_Introduction_WS20_21
Dr.-Ing. Thomas Przybilla
2023-01-16
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01:19:42
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2
REM_02_Instrumentation_WS20_21_Part 1of2 preview image
REM_02_Instrumentation_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:32:51
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3
REM_02_Instrumentation_WS20_21_Part 2of2 preview image
REM_02_Instrumentation_WS20_21_Part 2of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:25:22
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4
REM_03_Electron-Sample_Interaction_WS20_21_Part 1of3 preview image
REM_03_Electron-Sample_Interaction_WS20_21_Part 1of3
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:36:49
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5
REM_03_Electron-Sample_Interaction_WS20_21_Part 2of3 preview image
REM_03_Electron-Sample_Interaction_WS20_21_Part 2of3
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:26:54
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6
REM_03_Electron-Sample_Interaction_WS20_21_Part 3of3 preview image
REM_03_Electron-Sample_Interaction_WS20_21_Part 3of3
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
00:59:03
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7
REM_04_BSE+SE_imaging_WS20_21_Part 1of2 preview image
REM_04_BSE+SE_imaging_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:31:09
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8
REM_04_BSE+SE_imaging_WS20_21_Part 2of2 preview image
REM_04_BSE+SE_imaging_WS20_21_Part 2of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:30:47
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9
REM_05_Advanced SEM_STEM_WS20_21_Part 1of2 preview image
REM_05_Advanced SEM_STEM_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:29:56
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10
REM_05_Advanced SEM_STEM_WS20_21_Part 2of2 & REM_06_X-ray_Analysis_WS20_21_Part 1of2 preview image
REM_05_Advanced SEM_STEM_WS20_21_Part 2of2 & REM_06_X-ray_Analysis_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:27:30
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11
REM_06_X-ray_Analysis_WS20_21_Part 2of2 preview image
REM_06_X-ray_Analysis_WS20_21_Part 2of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:30:29
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12
REM_07_Focused_Ion_Beam_I_Instrumentation_WS20_21_Part 1of2 preview image
REM_07_Focused_Ion_Beam_I_Instrumentation_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:01:16
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13
REM_07_Focused_Ion_Beam_I_Instrumentation_WS20_21_Part 2of2 & REM_08_Focused_Ion_Beam_II_Practical_Aspects_WS20_21_Part 1of2 preview image
REM_07_Focused_Ion_Beam_I_Instrumentation_WS20_21_Part 2of2 & REM_08_Focused_Ion_Beam_II_Practical_Aspects_WS20_21_Part 1of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:27:07
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14
REM_08_Focused_Ion_Beam_II_Practical_Aspects_WS20_21_Part 2of2 preview image
REM_08_Focused_Ion_Beam_II_Practical_Aspects_WS20_21_Part 2of2
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:14:40
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15
REM_09_in-situ_SEM_WS20_21 preview image
REM_09_in-situ_SEM_WS20_21
Dr.-Ing. Thomas Przybilla
2023-01-18
IdM-Anmeldung
01:11:40
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